SSC Exam 2016 Notice Issued, JE Exam 2016 Rescheduled for Feb 2017: Check Here for All Updates
Staff Selection Commission (SSC) issued e-Admit Card for Sub-Inspectors in Delhi Police, CAPFS & ASI in CISF Tier-II Exam 2016. The admit card is released by SSC for various regions. Candidates can download the e-admit card by using their registration number/ roll number and date of birth
Staff Selection Commission (SSC) has issued a notice stating the updates for SSC Exam 2016. The commission has updated on all examination which are scheduled for SSC Recruitment 2016.
As per the updates, SSC has successfully conducted the Limited Departmental Competitive Examination of UDC on 3 December 2016 and SI in Delhi Police/CPOs and ASIs in CISF Examination-2016 (TIER-II) is scheduled to be held on 18 December 2016. The admit card for SI in Delhi Police/CPOs and ASIs in CISF Examination-2016 (TIER-II) for various regions are also released. Candidates can download the admit card from the link mentioned below.
However, the JE Examination 2016 (Paper-I) which was scheduled to be conducted from 20 December 2016 to 23 December 2016 is rescheduled due to administrative reasons. The JE Exam 2016 is now scheduled to be held in February 2017. The exact dates would be intimated by the commission soon. Candidate now have ample time to prepare for SSC JE Exam 2017.
Further, the Combined Higher Secondary Level Examination- 2016 (TIER-I) i.e., SSC CHSL Exam 2016 will be held as per the intimated schedule i.e., from 07 January 2017 to 05 February 2017. Candidates can click on the link given below for official notice issued by Staff Selection Commission.